IEC 60749-17 Ed. 1.0 b:2003

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IEC 60749-17 Ed. 1.0 b:2003 Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

standard by International Electrotechnical Commission, 02/20/2003

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Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

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Edition: 1.0 Published: 02/20/2003 Number of Pages: 11File Size: 1 file , 410 KB