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IEC 60749-23 Ed. 1.0 b:2004

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IEC 60749-23 Ed. 1.0 b:2004 Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

standard by International Electrotechnical Commission, 02/23/2004

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This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

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Edition: 1.0 Published: 02/23/2004 Number of Pages: 17File Size: 1 file , 500 KB