Full Description

The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.

Product Details

Edition: 1.0 Published: 03/09/2004 Number of Pages: 19File Size: 1 file , 470 KB