Could I help you?
> 20/30406234 DC:2020
New Reduced price! View larger

20/30406234 DC:2020

New product

20/30406234 DC:2020

BS IEC 63275-2 Ed.1.0. Semiconductor devices. Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors Part 2. Test bipolar degradation by body diode operating

More details

$10.43

-56%

$23.70

More info